X-ray Measurement Device

Definition

Accurate and reliable thickness measurement is essential in the metal industry to ensure the highest quality and efficiency. An X-ray measurement device for thickness measurement is an integral part of modern material testing. It operates using X-ray radiation and measures the thickness of a coating on a material. The method is based on the principle that the radiation passes through the coating and is partially absorbed. The thickness of the coating is then calculated based on the attenuation of the intensity of the returning radiation. This technology is fast, precise, and non-destructive, and is commonly used to measure galvanic layers on various materials.

Procedure

The X-ray measurement device for thickness measurement consists of an X-ray tube and a detector. The X-ray tube generates X-ray radiation, which is directed through the coating onto the material being measured. Some of the radiation is absorbed by the coating, while the rest passes through the material and reaches the detector. The detector measures the intensity of the returning radiation and converts these measurements into a thickness value of the coating. With the FischerScope X-Ray, we can measure the coating thickness of workpieces non-destructively and contactlessly. The measurement device is highly precise with an accuracy of +/- 0.1µm. Using the X-ray measurement device, we can accurately determine the thickness of the chrome layer on various base materials such as steel, stainless steel, copper, and copper alloys.

Advantages

• Highly precise measurement method 
• Measurement possible on various base materials 
• Traceable measurement values

Information

• Material specifications 
• If possible, workpiece drawings 
• Desired coating thickness